Nicolas Mauran

Publication Activity (10 Years)

Years Active: 2001-2021
Publications (10 Years): 2

Top Topics

Atomic Force Microscopy

Top Venues

Microelectron. Reliab.

IEEE Trans. Control. Syst. Technol.

Publications

Denis Lagrange, Nicolas Mauran, Lucien Schwab, Bernard Legrand
Low Latency Demodulation for High-Frequency Atomic Force Microscopy Probes. IEEE Trans. Control. Syst. Technol. 29 (5) (2021)
Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran
20 GHz on-chip measurement of ESD waveform for system level analysis. Microelectron. Reliab. 55 (11) (2015)
Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran
On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress. Microelectron. Reliab. 53 (9-11) (2013)
Jinyu Jason Ruan, Nicolas Monnereau, David Trémouilles, Nicolas Mauran, Fabio Coccetti, Nicolas Nolhier, Robert Plana
An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices. IEEE Trans. Instrum. Meas. 61 (2) (2012)
Jinyu Jason Ruan, George J. Papaioannou, Nicolas Nolhier, Nicolas Mauran, Marise Bafleur, Fabio Coccetti, Robert Plana
ESD failure signature in capacitive RF MEMS switches. Microelectron. Reliab. 48 (8-9) (2008)
David Trémouilles, Marise Bafleur, Géraldine Bertrand, Nicolas Nolhier, Nicolas Mauran, Lionel Lescouzères
Latch-up ring design guidelines to improve electrostatic discharge (ESD) protection scheme efficiency. IEEE J. Solid State Circuits 39 (10) (2004)
Géraldine Bertrand, Christelle Delage, Marise Bafleur, Nicolas Nolhier, Jean-Marie Dorkel, Quang Nguyen, Nicolas Mauran, David Trémouilles, Philippe Perdu
Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology. IEEE J. Solid State Circuits 36 (9) (2001)