Fabrice Caignet

Publication Activity (10 Years)

Years Active: 2000-2021
Publications (10 Years): 4

Top Topics

Evolvable Hardware

Predictive Modeling

Top Venues

Microelectron. Reliab.

IEEE Trans. Instrum. Meas.

Publications

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia
Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes. IEEE Trans. Instrum. Meas. 70 (2021)
Frédéric Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur
Prediction of LIN communication robustness against EFT events using dedicated failure models. Microelectron. Reliab. (2017)
Frédéric Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur
Impact of non-linear capacitances on transient waveforms during system level ESD stress. Microelectron. Reliab. 64 (2016)
Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran
20 GHz on-chip measurement of ESD waveform for system level analysis. Microelectron. Reliab. 55 (11) (2015)
Bertrand Courivaud, Nicolas Nolhier, Gilles Ferru, Marise Bafleur, Fabrice Caignet
Reliability of ESD protection devices designed in a 3D technology. Microelectron. Reliab. 54 (9-10) (2014)
Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran
On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress. Microelectron. Reliab. 53 (9-11) (2013)
Nicolas Monnereau, Fabrice Caignet, David Trémouilles, Nicolas Nolhier, Marise Bafleur
Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation. Microelectron. Reliab. 53 (2) (2013)
Ali Alaeldine, Nicolas Lacrampe, Alexandre Boyer, Richard Perdriau, Fabrice Caignet, Mohammed Ramdani, Etienne Sicard, M'hamed Drissi
Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits. Microelectron. J. 39 (12) (2008)
Fabrice Caignet, Sonia Delmas-Bendhia, Etienne Sicard
The challenge of signal integrity in deep-submicrometer CMOS technology. Proc. IEEE 89 (4) (2001)
Fabrice Caignet, S. D.-B. Dhia, Etienne Sicard
On the measurement of crosstalk in integrated circuits. IEEE Trans. Very Large Scale Integr. Syst. 8 (5) (2000)