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Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits.

Ali AlaeldineNicolas LacrampeAlexandre BoyerRichard PerdriauFabrice CaignetMohammed RamdaniEtienne SicardM'hamed Drissi
Published in: Microelectron. J. (2008)
Keyphrases
  • integrated circuit
  • data mining
  • printed circuit boards
  • electron beam
  • database
  • digital content
  • simulation software
  • metal oxide semiconductor