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The challenge of signal integrity in deep-submicrometer CMOS technology.

Fabrice CaignetSonia Delmas-BendhiaEtienne Sicard
Published in: Proc. IEEE (2001)
Keyphrases
  • cmos technology
  • low power
  • low voltage
  • spl times
  • power consumption
  • signal processing
  • parallel processing
  • low cost
  • frequency domain
  • power dissipation
  • high speed
  • image sequences