Sonia Ben Dhia

Publication Activity (10 Years)

Years Active: 2004-2021
Publications (10 Years): 1

Top Topics

Integrity Checking

Integrated Circuit

Hardware Description Language

Top Venues

Microelectron. Reliab.

IEEE Trans. Instrum. Meas.

Publications

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia
Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes. IEEE Trans. Instrum. Meas. 70 (2021)
He Huang, Alexandre Boyer, Sonia Ben Dhia
Electronic counterfeit detection based on the measurement of electromagnetic fingerprint. Microelectron. Reliab. 55 (9-10) (2015)
V. Tomasevic, Alexandre Boyer, Sonia Ben Dhia
Bandgap failure study due to parasitic bipolar substrate coupling in Smart Power mixed ICs. EMC Compo (2015)
Alexandre Boyer, Sonia Ben Dhia
Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits. J. Low Power Electron. 10 (1) (2014)
Sonia Ben Dhia, Alexandre Boyer
Design of on-chip sensors to monitor electromagnetic activity in ICs: Towards on-line diagnosis and self-healing. LATW (2014)
Sonia Ben Dhia, Alexandre Boyer
Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project. Microelectron. Reliab. 53 (9-11) (2013)
Sonia Ben Dhia, Alexandre Boyer
Electro-magnetic robustness of integrated circuits: from statement to prediction. EMC Compo (2013)
Alexandre Boyer, Sonia Ben Dhia
Effect of aging on power integrity of digital integrated circuits. LATW (2013)
Alexandre Boyer, Sonia Ben Dhia
Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission. EMC Compo (2013)
Alexandre Boyer, Sonia Ben Dhia, B. Li, C. Lemoine, Bertrand Vrignon
Prediction of Long-term Immunity of a Phase-Locked Loop. J. Electron. Test. 28 (6) (2012)
Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro
IC Immunity Modeling Process Validation Using On-Chip Measurements. J. Electron. Test. 28 (3) (2012)
Alexandre Boyer, Sonia Ben Dhia, B. Li, C. Lemoine, Bertrand Vrignon
Prediction of long-term immunity of a phase-locked loop. LATW (2011)
Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro
IC immunity modeling process validation using on-chip measurements. LATW (2011)
Syed Mahfuzul Aziz, Etienne Sicard, Sonia Ben Dhia
Effective Teaching of the Physical Design of Integrated Circuits Using Educational Tools. IEEE Trans. Educ. 53 (4) (2010)
C. Lochot, S. Calvet, Sonia Ben Dhia, Etienne Sicard
REGINA test mask: research on EMC guidelines for integrated automotive circuits. Microelectron. J. 35 (6) (2004)