Login / Signup
On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress.
Fabrice Caignet
Nicolas Nolhier
Marise Bafleur
A. Wang
Nicolas Mauran
Published in:
Microelectron. Reliab. (2013)
Keyphrases
</>
real time
low cost
high speed
higher level
artificial intelligence
information systems
data acquisition
lower level
analog vlsi
databases
social networks
image sequences
low level
evolvable hardware