Marise Bafleur

Publication Activity (10 Years)

Years Active: 1996-2018
Publications (10 Years): 8

Top Topics

Evolvable Hardware

Face To Face Collaborative Learning

Wireless Sensor

Power Consumption

Top Venues

Microelectron. Reliab.

IEEE Trans. Ind. Electron.

GreenCom/iThings/CPScom

Publications

F. El Mahboubi, Marise Bafleur, V. Boitier, Jean-Marie Dilhac
Energy-harvesting powered variable storage topology for battery-free wireless sensors. MOCAST (2018)
A. Siskos, F. El Mahboubi, V. Boitier, Th. Laopoulos, Marise Bafleur
A power management system using reconfigurable storage scheme for batteryless wireless sensor nodes. MOCAST (2018)
Mouna Mahane, David Trémouilles, Marise Bafleur, Benjamin Thon, Marianne Diatta, Lionel Jaouen
New triggering-speed-characterization method for diode-triggered SCR using TLP. Microelectron. Reliab. (2017)
Zheng Jun Chew, Tingwen Ruan, Meiling Zhu, Marise Bafleur, Jean-Marie Dilhac
Single Piezoelectric Transducer as Strain Sensor and Energy Harvester Using Time-Multiplexing Operation. IEEE Trans. Ind. Electron. 64 (12) (2017)
Nathalie Labat, François Marc, Hélène Frémont, Marise Bafleur
Proceedings of the 28th European Symposium on the reliability of electron devices, failure physics and analysis. Microelectron. Reliab. (2017)
Frédéric Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur
Prediction of LIN communication robustness against EFT events using dedicated failure models. Microelectron. Reliab. (2017)
Frédéric Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur
Impact of non-linear capacitances on transient waveforms during system level ESD stress. Microelectron. Reliab. 64 (2016)
Zheng Jun Chew, Tingwen Ruan, Meiling Zhu, Marise Bafleur, Jean-Marie Dilhac
A multifunctional device as both strain sensor and energy harvester for structural health monitoring. IEEE SENSORS (2016)
Marise Bafleur, Philippe Perdu, François Marc, Hélène Frémont, Nicolas Nolhier
Editorial. Microelectron. Reliab. 55 (9-10) (2015)
Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran
20 GHz on-chip measurement of ESD waveform for system level analysis. Microelectron. Reliab. 55 (11) (2015)
Houssam Arbess, Marise Bafleur, David Trémouilles, Moustafa Zerarka
Optimization of a MOS-IGBT-SCR ESD protection component in smart power SOI technology. Microelectron. Reliab. 55 (9-10) (2015)
Bertrand Courivaud, Nicolas Nolhier, Gilles Ferru, Marise Bafleur, Fabrice Caignet
Reliability of ESD protection devices designed in a 3D technology. Microelectron. Reliab. 54 (9-10) (2014)
Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran
On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress. Microelectron. Reliab. 53 (9-11) (2013)
Nicolas Monnereau, Fabrice Caignet, David Trémouilles, Nicolas Nolhier, Marise Bafleur
Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation. Microelectron. Reliab. 53 (2) (2013)
Marise Bafleur, Jean-Marie Dilhac
Towards Energy Autonomy of Wireless Sensors in Aeronautics Applications: SMARTER Collaborative Project. GreenCom/iThings/CPScom (2013)
A. Takacs, Hervé Aubert, Marise Bafleur, Jean-Marie Dilhac, F. Courtade, S. Fredon, L. Despoisse, C. Vanhecke, G. Cluzet
Energy Harvesting for Powering Wireless Sensor Networks On-Board Geostationary Broadcasting Satellites. GreenCom (2012)
Moustafa Zerarka, Patrick Austin, Marise Bafleur
Comparative study of sensitive volume and triggering criteria of SEB in 600 V planar and trench IGBTs. Microelectron. Reliab. 51 (9-11) (2011)
Houssam Arbess, Marise Bafleur
MOS-IGBT power devices for high-temperature operation in smart power SOI technology. Microelectron. Reliab. 51 (9-11) (2011)
J. Bourgeat, Christophe Entringer, Philippe Galy, Marise Bafleur, D. Marin-Cudraz
Evaluation of the ESD performance of local protections based on SCR or bi-SCR with dynamic or static trigger circuit in 32 nm. Microelectron. Reliab. 50 (9-11) (2010)
Marianne Diatta, Emilien Bouyssou, David Trémouilles, P. Martinez, F. Roqueta, O. Ory, Marise Bafleur
Failure mechanisms of discrete protection device subjected to repetitive electrostatic discharges (ESD). Microelectron. Reliab. 49 (9-11) (2009)
Jinyu Jason Ruan, George J. Papaioannou, Nicolas Nolhier, Nicolas Mauran, Marise Bafleur, Fabio Coccetti, Robert Plana
ESD failure signature in capacitive RF MEMS switches. Microelectron. Reliab. 48 (8-9) (2008)
Jinyu Jason Ruan, Nicolas Nolhier, Marise Bafleur, Laurent Bary, Fabio Coccetti, T. Lisec, Robert Plana
Electrostatic discharge failure analysis of capacitive RF MEMS switches. Microelectron. Reliab. 47 (9-11) (2007)
Yuan Gao, Nicolas Guitard, Christophe Salamero, Marise Bafleur, Laurent Bary, Laurent Escotte, Patrick Gueulle, Lionel Lescouzères
Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements. Microelectron. Reliab. 47 (9-11) (2007)
A. Crosson, Laurent Escotte, Marise Bafleur, D. Talbourdet, L. Crétinon, Philippe Perdu, Guy Perez
Long-term reliability of silicon bipolar transistors subjected to low constraints. Microelectron. Reliab. 47 (9-11) (2007)
Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis
Application of various optical techniques for ESD defect localization. Microelectron. Reliab. 46 (9-11) (2006)
C. Lochot, J. P. Lainé, Marise Bafleur, A. Cazarré, J. Tasselli
Potentialities of substrate-thinning technique to control minority carrier injection in smart power IC's. Microelectron. J. 37 (8) (2006)
Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectron. Reliab. 45 (9-11) (2005)
David Trémouilles, Marise Bafleur, Géraldine Bertrand, Nicolas Nolhier, Nicolas Mauran, Lionel Lescouzères
Latch-up ring design guidelines to improve electrostatic discharge (ESD) protection scheme efficiency. IEEE J. Solid State Circuits 39 (10) (2004)
Fabien Essely, Corinne Bestory, Nicolas Guitard, Marise Bafleur, A. Wislez, E. Doche, Philippe Perdu, André Touboul, Dean Lewis
Study of the ESD defects impact on ICs reliability. Microelectron. Reliab. 44 (9-11) (2004)
Nicolas Guitard, David Trémouilles, Marise Bafleur, Laurent Escotte, Laurent Bary, Philippe Perdu, Gérard Sarrabayrouse, Nicolas Nolhier, Roberto Reyna-Rojas
Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications. Microelectron. Reliab. 44 (9-11) (2004)
David Trémouilles, Géraldine Bertrand, Marise Bafleur, Felix Beaudoin, Philippe Perdu, Nicolas Guitard, Lionel Lescouzères
TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. Microelectron. Reliab. 43 (1) (2003)
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectron. Reliab. 43 (3) (2003)
M. Zecri, P. Besse, P. Givelin, M. Nayrolles, Marise Bafleur, Nicolas Nolhier
Determination of the ESD Failure Cause Through its Signature. Microelectron. Reliab. 43 (9-11) (2003)
Marise Bafleur
In the memory of Georges Charitat. Microelectron. Reliab. 42 (8) (2002)
Géraldine Bertrand, Christelle Delage, Marise Bafleur, Nicolas Nolhier, Jean-Marie Dorkel, Quang Nguyen, Nicolas Mauran, David Trémouilles, Philippe Perdu
Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology. IEEE J. Solid State Circuits 36 (9) (2001)
Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectron. Reliab. 41 (9-10) (2001)
Christelle Delage, Nicolas Nolhier, Marise Bafleur, Jean-Marie Dorkel, Jo Hamid, Philippe Givelin, Jacques Lin-Kwang
The mirrored lateral SCR (MILSCR) as an ESD protection structure: design and optimization using 2-D device simulation. IEEE J. Solid State Circuits 34 (9) (1999)
Stelios Siskos, Th. Laopoulos, Alkiviades A. Hatzopoulos, Marise Bafleur
A current conveyor based BIC sensor for current monitoring in mixed-signal circuits. ICECS (1996)