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Proceedings of the 28th European Symposium on the reliability of electron devices, failure physics and analysis.
Nathalie Labat
François Marc
Hélène Frémont
Marise Bafleur
Published in:
Microelectron. Reliab. (2017)
Keyphrases
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computer science
international conference
international workshop
artificial intelligence
database
data mining
failure rate
information systems
data analysis
mobile devices
image analysis