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ESD failure signature in capacitive RF MEMS switches.
Jinyu Jason Ruan
George J. Papaioannou
Nicolas Nolhier
Nicolas Mauran
Marise Bafleur
Fabio Coccetti
Robert Plana
Published in:
Microelectron. Reliab. (2008)
Keyphrases
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relevance feedback
radio frequency
signature verification
signature recognition
learning algorithm
signature scheme
failure rate
real time
computer vision
failure detection
component failures
signal strength
highly reliable
digital signature
supply chain
expert systems
genetic algorithm