M. Zecri

Publication Activity (10 Years)

Years Active: 2002-2003
Publications (10 Years): 0

Publications

M. Zecri, P. Besse, P. Givelin, M. Nayrolles, Marise Bafleur, Nicolas Nolhier
Determination of the ESD Failure Cause Through its Signature. Microelectron. Reliab. 43 (9-11) (2003)
Oliver Perat, Jean-Marie Dorkel, E. Scheid, Pierre Temple-Boyer, Y. S. Chung, A. Peyre-Lavigne, M. Zecri, Patrick Tounsi
Characterization method of thermomechanical parameters for microelectronic materials. Microelectron. Reliab. 42 (7) (2002)