Characterization method of thermomechanical parameters for microelectronic materials.
Oliver PeratJean-Marie DorkelE. ScheidPierre Temple-BoyerY. S. ChungA. Peyre-LavigneM. ZecriPatrick TounsiPublished in: Microelectron. Reliab. (2002)
Keyphrases
- high accuracy
- sensitivity analysis
- classification method
- theoretical analysis
- maximum likelihood estimation
- high precision
- experimental evaluation
- optimization algorithm
- detection method
- significant improvement
- cost function
- edge detection
- parameter selection
- data sets
- em algorithm
- prior knowledge
- pairwise
- preprocessing
- learning algorithm