E. Scheid

Publication Activity (10 Years)

Years Active: 2002-2009
Publications (10 Years): 0

Publications

Jean-Baptiste Sauveplane, E. Scheid, A. Deram
chip metallization of a power semiconductor device. Microelectron. Reliab. 49 (5) (2009)
Jean-Baptiste Sauveplane, Patrick Tounsi, E. Scheid, A. Deram
3D electro-thermal investigations for reliability of ultra low ON state resistance power MOSFET. Microelectron. Reliab. 48 (8-9) (2008)
B. Khong, Marc Legros, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Colette Levade, G. Vanderschaeve, E. Scheid
Characterization and modelling of ageing failures on power MOSFET devices. Microelectron. Reliab. 47 (9-11) (2007)
Oliver Perat, Jean-Marie Dorkel, E. Scheid, Pierre Temple-Boyer, Y. S. Chung, A. Peyre-Lavigne, M. Zecri, Patrick Tounsi
Characterization method of thermomechanical parameters for microelectronic materials. Microelectron. Reliab. 42 (7) (2002)