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Characterization and modelling of ageing failures on power MOSFET devices.
B. Khong
Marc Legros
Patrick Tounsi
Philippe Dupuy
X. Chauffleur
Colette Levade
G. Vanderschaeve
E. Scheid
Published in:
Microelectron. Reliab. (2007)
Keyphrases
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mobile devices
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root cause
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fault tolerance
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real world
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