Pierre Temple-Boyer

Publication Activity (10 Years)

Years Active: 2001-2014
Publications (10 Years): 0

Top Topics

Automatic Detection

Application Specific

Multiresolution

Top Venues

Publications

Abdou Karim Diallo, Lyes Djeghlaf, Jérôme Launay, Pierre Temple-Boyer
Modelling of Impulsional pH Variations Using ChemFET-Based Microdevices: Application to Hydrogen Peroxide Detection. Sensors 14 (2) (2014)
Ramdane Mahamdi, Laurent Saci, Farida Mansour, Pierre Temple-Boyer, Emmanuel Scheid, Laurent Jalabert
MOS structure: Characterization and modeling. Microelectron. J. 40 (1) (2009)
N. Crespy, Johann Courteaud, Philippe Combette, Pierre Temple-Boyer, Alain Giani, A. Foucaran
Micromachined Inclinometer Based on Fluid Convection CoRR (2008)
Bekkay Hajji, Salah Eddine Naimi, Iryna Humenyuk, Jérôme Launay, Pierre Temple-Boyer
Behavioral Modeling of The pH-ISFET Temperature Influence. ICECS (2007)
B. Torbiéro, M. L. Pourciel-Gouzy, Iryna Humenyuk, J. B. Doucet, A. Martinez, Pierre Temple-Boyer
Mass patterning of polysiloxane layers using spin coating and photolithography techniques. Microelectron. J. 37 (2) (2006)
Iryna Humenyuk, B. Torbiéro, S. Assié-Souleille, R. Colin, X. Dollat, B. Franc, A. Martinez, Pierre Temple-Boyer
-isfets microsensors for water analysis. Microelectron. J. 37 (6) (2006)
Andrzej Filipkowski, Zbigniew Brzozka, Wojciech Wróblewski, Leszek J. Opalski, Jan Ogrodzki, Andrzej Kobus, B. Jaroszewicz, Pompeo Moscetta, Luca Sanfilippo, Roza Allabashi, Pierre Temple-Boyer, Iryna Humenyuk
System for European Water Monitoring (SEWING). EnviroInfo (2005)
Pierre Temple-Boyer, Jérôme Launay, Iryna Humenyuk, T. Do Conto, A. Martinez, C. Bériet, A. Grisel
Study of front-side connected chemical field effect transistor for water analysis. Microelectron. Reliab. 44 (3) (2004)
Oliver Perat, Jean-Marie Dorkel, E. Scheid, Pierre Temple-Boyer, Y. S. Chung, A. Peyre-Lavigne, M. Zecri, Patrick Tounsi
Characterization method of thermomechanical parameters for microelectronic materials. Microelectron. Reliab. 42 (7) (2002)
Laurent Jalabert, Pierre Temple-Boyer, Gérard Sarrabayrouse, F. Cristiano, B. Colombeau, F. Voillot, C. Armand
Reduction of boron penetration through thin silicon oxide with a nitrogen doped silicon layer. Microelectron. Reliab. 41 (7) (2001)