Laurent Escotte

Publication Activity (10 Years)

Years Active: 1999-2011
Publications (10 Years): 0

Publications

Emilie Leynia de la Jarrige, Laurent Escotte, Eric Gonneau, Jean-Marc Goutoule
Long-term stability of an SiGe HBT-based active cold load. IGARSS (2011)
Yuan Gao, Nicolas Guitard, Christophe Salamero, Marise Bafleur, Laurent Bary, Laurent Escotte, Patrick Gueulle, Lionel Lescouzères
Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements. Microelectron. Reliab. 47 (9-11) (2007)
A. Crosson, Laurent Escotte, Marise Bafleur, D. Talbourdet, L. Crétinon, Philippe Perdu, Guy Perez
Long-term reliability of silicon bipolar transistors subjected to low constraints. Microelectron. Reliab. 47 (9-11) (2007)
Nicolas Guitard, David Trémouilles, Marise Bafleur, Laurent Escotte, Laurent Bary, Philippe Perdu, Gérard Sarrabayrouse, Nicolas Nolhier, Roberto Reyna-Rojas
Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications. Microelectron. Reliab. 44 (9-11) (2004)
Sabine Long, Laurent Escotte, Jacques Graffeuil, F. Brasseau, J. L. Cazaux
On-wafer noise characterization of low-noise amplifiers in the Ka-band. IEEE Trans. Instrum. Meas. 52 (5) (2003)
Laurent Escotte, Jean-Guy Tartarin, Jacques Graffeuil
A cost-effective technique for extending the low-frequency range of a microwave noise parameter test set. IEEE Trans. Instrum. Meas. 48 (4) (1999)