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On-wafer noise characterization of low-noise amplifiers in the Ka-band.
Sabine Long
Laurent Escotte
Jacques Graffeuil
F. Brasseau
J. L. Cazaux
Published in:
IEEE Trans. Instrum. Meas. (2003)
Keyphrases
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noise level
noise reduction
noisy data
random noise
real time
signal to noise ratio
additive noise
neural network
image noise
low signal to noise ratio
high noise
image segmentation
missing data
sensor noise