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Long-term reliability of silicon bipolar transistors subjected to low constraints.
A. Crosson
Laurent Escotte
Marise Bafleur
D. Talbourdet
L. Crétinon
Philippe Perdu
Guy Perez
Published in:
Microelectron. Reliab. (2007)
Keyphrases
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high density
long term
field effect transistors
short term
constraint satisfaction
high speed
cmos technology
constraint programming
low power
space charge
information systems
linear constraints
high levels
data center
steady state
constraint satisfaction problems
low cost
case study