Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements.
Yuan GaoNicolas GuitardChristophe SalameroMarise BafleurLaurent BaryLaurent EscottePatrick GueulleLionel LescouzèresPublished in: Microelectron. Reliab. (2007)
Keyphrases
- low frequency
- high frequency
- electromagnetic fields
- frequency domain
- wavelet transform
- frequency band
- subband
- dc dc converter
- high resolution
- discrete wavelet transform
- wavelet coefficients
- low pass
- fusion rules
- real time
- image compression
- computer vision
- low and high frequency
- high frequency components
- input output
- wavelet domain
- image processing
- neural network