A cost-effective technique for extending the low-frequency range of a microwave noise parameter test set.
Laurent EscotteJean-Guy TartarinJacques GraffeuilPublished in: IEEE Trans. Instrum. Meas. (1999)
Keyphrases
- low frequency
- cost effective
- test set
- high frequency
- frequency band
- frequency domain
- error rate
- wavelet transform
- low cost
- electromagnetic fields
- training set
- subband
- training data
- test data
- cost effectiveness
- discrete wavelet transform
- wavelet coefficients
- low pass
- high frequency components
- low and high frequency
- evaluation methodology
- multiresolution
- multiscale
- wavelet domain
- transfer function
- dct coefficients
- feature selection