Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications.
Nicolas GuitardDavid TrémouillesMarise BafleurLaurent EscotteLaurent BaryPhilippe PerduGérard SarrabayrouseNicolas NolhierRoberto Reyna-RojasPublished in: Microelectron. Reliab. (2004)
Keyphrases
- low frequency
- high reliability
- defect detection
- high frequency
- frequency domain
- high precision
- electromagnetic fields
- low cost
- wavelet transform
- feature extraction
- subband
- wavelet coefficients
- low overhead
- wavelet analysis
- frequency band
- high resolution
- discrete wavelet transform
- original images
- high frequency components
- real time
- low pass
- spatial domain
- image compression
- low and high frequency
- wavelet domain
- measurement noise
- textured surfaces
- fusion rules
- multiresolution
- image analysis