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Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications.

Nicolas GuitardDavid TrémouillesMarise BafleurLaurent EscotteLaurent BaryPhilippe PerduGérard SarrabayrouseNicolas NolhierRoberto Reyna-Rojas
Published in: Microelectron. Reliab. (2004)
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