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Study of the ESD defects impact on ICs reliability.

Fabien EsselyCorinne BestoryNicolas GuitardMarise BafleurA. WislezE. DochePhilippe PerduAndré TouboulDean Lewis
Published in: Microelectron. Reliab. (2004)
Keyphrases
  • real time
  • empirical studies
  • machine learning
  • learning algorithm
  • multiscale
  • multi agent
  • relational databases
  • statistical analysis
  • simulation study
  • factors that influence