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Failure mechanisms of discrete protection device subjected to repetitive electrostatic discharges (ESD).

Marianne DiattaEmilien BouyssouDavid TrémouillesP. MartinezF. RoquetaO. OryMarise Bafleur
Published in: Microelectron. Reliab. (2009)
Keyphrases
  • discrete version
  • information security
  • failure prediction
  • computational models
  • mechanisms underlying
  • high voltage
  • equivalent circuit
  • data sets
  • multiscale
  • data acquisition
  • input parameters