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Evaluation of the ESD performance of local protections based on SCR or bi-SCR with dynamic or static trigger circuit in 32 nm.
J. Bourgeat
Christophe Entringer
Philippe Galy
Marise Bafleur
D. Marin-Cudraz
Published in:
Microelectron. Reliab. (2010)
Keyphrases
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static analysis
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