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Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation.

Romain DesplatsFelix BeaudoinPhilippe PerduPatrick PoirierDavid TrémouillesMarise BafleurDean Lewis
Published in: Microelectron. Reliab. (2001)
Keyphrases
  • fault diagnosis
  • artificial intelligence
  • neural network
  • fault detection
  • information retrieval
  • social networks
  • expert systems
  • infrared
  • visible spectrum
  • multiple faults