Login / Signup

Electrostatic discharge failure analysis of capacitive RF MEMS switches.

Jinyu Jason RuanNicolas NolhierMarise BafleurLaurent BaryFabio CoccettiT. LisecRobert Plana
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • statistical analysis
  • quantitative analysis
  • data sets
  • neural network
  • data mining
  • machine learning
  • information retrieval
  • computer vision
  • e learning
  • high level
  • similarity measure
  • multiscale
  • hidden markov models