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On the measurement of crosstalk in integrated circuits.

Fabrice CaignetS. D.-B. DhiaEtienne Sicard
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2000)
Keyphrases
  • integrated circuit
  • correlation analysis
  • electron beam
  • computer vision
  • case study
  • neural network
  • information retrieval
  • knowledge base
  • three dimensional
  • hardware description language