ATOMIC FORCE MICROSCOPY
Experts
- Ning Xi
- Lianqing Liu
- Guangyong Li
- Zaili Dong
- Michael G. Ruppert
- S. O. Reza Moheimani
- Yuechao Wang
- Murti V. Salapaka
- Sean B. Andersson
- Sergey Belikov
- Michael R. P. Ragazzon
- Ian R. Petersen
- Sergei Magonov
- Hemanshu Roy Pota
- Georg Schitter
- Wen Jung Li
- Jan Tommy Gravdahl
- Li-Chen Fu
- Kamal Youcef-Toumi
- Luca Benini
- Andrew J. Fleming
- Takaharu Okajima
- Josep Miquel Jornet
- Uchechukwu C. Wejinya
- Jing Hou
- David M. Harcombe
- Yuen Kuan Yong
- Kazuhisa Sueoka
- Tobias Knopp
- Thorsten M. Buzug
- Agus Subagyo
- M. S. Rana
- Mostafa Fatemi
- John Alexander
- Sajal K. Das
- Zhidong Wang
- Daniele Palossi
- Ryosuke Takahashi
- Mi Li
Venues
- CoRR
- Sensors
- ACC
- NEMS
- NeuroImage
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Medical Imaging
- Microelectron. Reliab.
- IGARSS
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Biomed. Eng.
- IEEE Access
- IROS
- NANOARCH
- EMBC
- Microelectron. J.
- ICTON
- MHS
- Proc. IEEE
- Int. J. Imaging Syst. Technol.
- IEEE Trans Autom. Sci. Eng.
- IEEE Trans. Control. Syst. Technol.
- J. Digit. Imaging
- Bildverarbeitung für die Medizin
- SIAM J. Imaging Sci.
- ISBI
- ICRA
- CDC
- AIM
- Computational Imaging
- Remote. Sens.
- ROBIO
- IEEE SENSORS
- J. Imaging
- IEEE Trans. Image Process.
- IEEE Geosci. Remote. Sens. Lett.
- IEICE Trans. Electron.
- IEEE Trans. Ind. Electron.
- Nano Commun. Networks
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