Low Latency Demodulation for High-Frequency Atomic Force Microscopy Probes.
Denis LagrangeNicolas MauranLucien SchwabBernard LegrandPublished in: IEEE Trans. Control. Syst. Technol. (2021)
Keyphrases
- high frequency
- low latency
- atomic force microscopy
- low frequency
- high speed
- high throughput
- real time
- highly efficient
- virtual machine
- stream processing
- wavelet coefficients
- high resolution
- subband
- wavelet transform
- high frequencies
- high frequency components
- multiresolution
- continuous query processing
- discrete wavelet transform
- machine learning