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3D Electro-thermal modelling of bonding and metallization ageing effects for reliability improvement of power MOSFETs.
Toufik Azoui
Patrick Tounsi
Philippe Dupuy
L. Guillot
Jean-Marie Dorkel
Published in:
Microelectron. Reliab. (2011)
Keyphrases
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power consumption
infrared
electrical power
neural network
data sets
machine learning
social networks
significant improvement
power supply
highly reliable
positive effects
thermal images
power distribution systems