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- Vishal M. Patel
- Shuowen Hu
- Benjamin S. Riggan
- Jiayi Ma
- Thirimachos Bourlai
- Nathaniel J. Short
- Nasser M. Nasrabadi
- Xavier Maldague
- Xiao-Jun Wu
- Matthew Montanaro
- Shangfei Wang
- Ognjen Arandjelovic
- Chang Li
- Mita Nasipuri
- Allen Lunsford
- Zhihua Xie
- Marcos Faúndez-Zanuy
- B. V. K. Vijaya Kumar
- Jirí Mekyska
- Jing Li
- Svetlana N. Yanushkevich
- Xing Di
- Reza Shoja Ghiass
- Debotosh Bhattacharjee
- Christoph Busch
- Dennis Reuter
- Ayan Seal
- Xiaoxiong Xiong
- Sheldon X.-D. Tan
- Arun Ross
- Hakim Bendada
- Enric Valor
- Ioannis T. Pavlidis
- Guillaume-Alexandre Bilodeau
- Cunjian Chen
- Hongtao Huo
- Hui Li
- He Zhang
- Simon J. Hook
Venues
- CoRR
- Sensors
- Remote. Sens.
- IEEE Access
- IGARSS
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Instrum. Meas.
- Microelectron. Reliab.
- IEEE Geosci. Remote. Sens. Lett.
- Multim. Tools Appl.
- CVPR Workshops
- ICIP
- ACM Multimedia
- EMBC
- Expert Syst. Appl.
- Microelectron. J.
- Comput. Electron. Agric.
- CVPR
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- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- Inf. Fusion
- ISCAS
- Entropy
- IECON
- IEEE Trans. Circuits Syst. Video Technol.
- IROS
- Int. J. Appl. Earth Obs. Geoinformation
- ICASSP
- Image Vis. Comput.
- SIU
- WACV
- IEEE Signal Process. Lett.
- IJCNN
- IEEE Trans. Image Process.
- NEMS
- Pattern Recognit.
- AVSS
- FUSION
- Neural Comput. Appl.
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