Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue.
B. KhongPatrick TounsiPhilippe DupuyX. ChauffleurMarc LegrosA. DeramColette LevadeG. VanderschaeveJean-Marie DorkelJean-Pierre FradinPublished in: Microelectron. Reliab. (2005)