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Study of mechanical stress impact on the I-V characteristics of a power VDMOS device using 2D FEM simulations.

Emmanuel MarcaultMarie BreilA. BourennanePatrick TounsiJean-Marie Dorkel
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • finite element
  • main factors
  • neural network
  • empirical studies
  • simulation study
  • experimental study
  • numerical simulations
  • factors affecting
  • potential impact