Deep learning of crystalline defects from TEM images: a solution for the problem of 'never enough training data'.
Kishan GovindDaniela OliverosAntonin DlouhyMarc LegrosStefan SandfeldPublished in: Mach. Learn. Sci. Technol. (2024)
Keyphrases
- deep learning
- transmission electron microscopy
- training data
- image database
- input image
- object recognition
- image features
- three dimensional
- test images
- image classification
- image retrieval
- data sets
- unsupervised learning
- learning algorithm
- machine learning
- x ray
- image regions
- multiple images
- target object
- lighting conditions
- supervised learning
- region of interest
- co occurrence
- pattern recognition
- reinforcement learning
- computer vision
- data mining