Upgrading In-Circuit Test of High Density PCBAs Using Electromagnetic Measurement and Principal Component Analysis.
Nabil El Belghiti AlaouiAlexandre BoyerPatrick TounsiArnaud ViardPublished in: J. Electron. Test. (2018)
Keyphrases
- high density
- principal component analysis
- low density
- close proximity
- high speed
- high power
- high bandwidth
- data center
- magnetic recording
- magnetic tape
- field effect transistors
- discriminant analysis
- principal components
- dimensionality reduction
- independent component analysis
- linear discriminant analysis
- databases
- dimension reduction
- test data
- test cases
- low dimensional
- low cost
- data points
- face recognition
- neural network