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New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs.

Nabil El Belghiti AlaouiPatrick TounsiAlexandre BoyerArnaud Viard
Published in: NATW (2018)
Keyphrases
  • high density
  • query processing
  • close proximity
  • mathematical analysis
  • electromagnetic field
  • image processing
  • high speed
  • theoretical analysis
  • magnetic recording