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New defect detection approach using near electromagnetic field probing of high density PCBAs.
Nabil El Belghiti Alaoui
Alexandre Boyer
Patrick Tounsi
Arnaud Viard
Published in:
Microelectron. Reliab. (2018)
Keyphrases
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defect detection
high density
electromagnetic field
electromagnetic fields
low density
close proximity
high power
feature extraction
data center
thin film
haptic feedback
finite element method
high bandwidth
magnetic recording
computer vision
low cost
sufficient conditions
cloud computing
sensor networks
real time