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Back gate bias effect and layout dependence on Random Telegraph Noise in FDSOI technologies.
P. Srinivasan
Da Song
David Rose
Maurice LaCroix
Arunima Dasgupta
Published in:
IRPS (2021)
Keyphrases
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missing data
random noise
additive noise
noise level
noise sensitivity
data sets
emerging technologies
data mining
noise reduction
st century
noisy images
arbitrary shape
uniformly distributed
signal to noise ratio
noisy data
spatial layout
low signal to noise ratio
classification noise