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Impact of Non-Conducting HCI Degradation on Small-Signal Parameters in RF SOI MOSFET.

Dora A. Chaparro-OrtizAlan Y. Otero-CarrascalEdmundo A. Gutiérrez-D.Reydezel Torres-TorresOscar Huerta-GuevaraP. SrinivasanFernando Guarin
Published in: IRPS (2023)
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