CMOS reliability: From discrete device degradation to circuit aging.
Tanya NigamPublished in: VLSI-DAT (2013)
Keyphrases
- circuit design
- metal oxide semiconductor
- high speed
- analog vlsi
- software aging
- delay insensitive
- semiconductor devices
- silicon on insulator
- cmos technology
- low voltage
- field effect transistors
- low power
- gate dielectrics
- vlsi circuits
- ultra low power
- integrated circuit
- reliability analysis
- low cost
- chip design
- power dissipation
- data acquisition
- neural network
- application server
- discrete space
- age related
- analog circuits
- power consumption
- power reduction
- discrete geometry
- focal plane
- real time