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CMOS reliability: From discrete device degradation to circuit aging.
Tanya Nigam
Published in:
VLSI-DAT (2013)
Keyphrases
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circuit design
metal oxide semiconductor
high speed
analog vlsi
software aging
delay insensitive
semiconductor devices
silicon on insulator
cmos technology
low voltage
field effect transistors
low power
gate dielectrics
vlsi circuits
ultra low power
integrated circuit
reliability analysis
low cost
chip design
power dissipation
data acquisition
neural network
application server
discrete space
age related
analog circuits
power consumption
power reduction
discrete geometry
focal plane
real time