Stefan De Gendt

Publication Activity (10 Years)

Years Active: 1999-2023
Publications (10 Years): 9

Top Topics

Code Generation

Feature Extractor

Energy Distribution

Machine Learning

Top Venues

Microelectron. Reliab.

J. Chem. Inf. Model.

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
Optimizing YOLOv7 for Semiconductor Defect Detection. CoRR (2023)
Enrique Dehaerne, Bappaditya Dey, Hossein Esfandiar, Lander Verstraete, Hyo Seon Suh, Sandip Halder, Stefan De Gendt
YOLOv8 for Defect Inspection of Hexagonal Directed Self-Assembly Patterns: A Data-Centric Approach. CoRR (2023)
Thibault Lechien, Enrique Dehaerne, Bappaditya Dey, Víctor Blanco, Sandip Halder, Stefan De Gendt
Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review. CoRR (2023)
Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization. CoRR (2023)
Vic De Ridder, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Stefan De Gendt, Bartel Van Waeyenberge
SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection. CoRR (2023)
Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation. CoRR (2023)
Esteban Marques, Stefan De Gendt, Geoffrey Pourtois, Michiel J. van Setten
Improving Accuracy and Transferability of Machine Learning Chemical Activation Energies by Adding Electronic Structure Information. J. Chem. Inf. Model. 63 (5) (2023)
Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt, Wannes Meert
Code Generation Using Machine Learning: A Systematic Review. IEEE Access 10 (2022)
Giovanni V. Resta, Alessandra Leonhardt, Yashwanth Balaji, Stefan De Gendt, Pierre-Emmanuel Gaillardon, Giovanni De Micheli
Devices and Circuits Using Novel 2-D Materials: A Perspective for Future VLSI Systems. IEEE Trans. Very Large Scale Integr. Syst. 27 (7) (2019)
Sharifah Wan Muhamad Hatta, Zhigang Ji, Jianfu Zhang, Weidong Zhang, Norhayati Soin, Ben Kaczer, Stefan De Gendt, Guido Groeseneken
Energy distribution of positive charges in high-k dielectric. Microelectron. Reliab. 54 (9-10) (2014)
Albin Bayerl, Mario Lanza, Lidia Aguilera, Marc Porti, Montserrat Nafría, Xavier Aymerich, Stefan De Gendt
Nanoscale and device level electrical behavior of annealed ALD Hf-based gate oxide stacks grown with different precursors. Microelectron. Reliab. 53 (6) (2013)
M. Houssa, Marc Aoulaiche, Stefan De Gendt, Guido Groeseneken, Marc M. Heyns
Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: Electrical characterization and modeling. Microelectron. Reliab. 47 (6) (2007)
Z. Li, Tom Schram, Luigi Pantisano, A. Stesmans, Thierry Conard, S. Shamuilia, V. V. Afanasiev, A. Akheyar, Sven Van Elshocht, D. P. Brunco, W. Deweerd, Y. Naoki, P. Lehnen, Stefan De Gendt, Kristin De Meyer
shifts of Ru gated stacks. Microelectron. Reliab. 47 (4-5) (2007)
G. S. Lujan, Wim Magnus, L.-Å. Ragnarsson, S. Kubicek, Stefan De Gendt, Marc M. Heyns, Kristin De Meyer
Modelling mobility degradation due to remote Coulomb scattering from dielectric charges and its impact on MOS device performance. Microelectron. Reliab. 45 (5-6) (2005)
Vidya Kaushik, Martine Claes, Annelies Delabie, Sven Van Elshocht, Olivier Richard, Thierry Conard, Erika Rohr, Thomas Witters, Matty Caymax, Stefan De Gendt
high-K gate dielectric layers. Microelectron. Reliab. 45 (5-6) (2005)
Chao Zhao, Gert Roebben, Hugo Bender, Edward Young, S. Haukka, Michel Houssa, Mohamed Naili, Stefan De Gendt, Marc M. Heyns, Omer Van der Biest
thin films during high temperature X-ray diffraction. Microelectron. Reliab. 41 (7) (2001)
Marc M. Heyns, Twan Bearda, Ingrid Cornelissen, Stefan De Gendt, Robin Degraeve, Guido Groeseneken, Conny Kenens, D. Martin Knotter, Lee M. Loewenstein, Paul W. Mertens, Sofie Mertens, Marc Meuris, Tanya Nigam, Marc Schaekers, Ivo Teerlinck, Wilfried Vandervorst, Rita Vos, Klaus Wolke
Cost-effective cleaning and high-quality thin gate oxides. IBM J. Res. Dev. 43 (3) (1999)