Zhigang Ji

Publication Activity (10 Years)

Years Active: 2009-2024
Publications (10 Years): 49

Top Topics

Comparative Study

Statistical Distribution

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Dinghao Chen, Wenjie Zhu, Xiaoman Yang, Pengpeng Ren, Zhigang Ji, Hai-Bao Chen
Physics-Informed Learning for EPG-Based TDDB Assessment. ASPDAC (2024)
Longda Zhou, Jie Li, Pengpeng Ren, Sheng Ye, Da Wang, Zheng Qiao, Zhigang Ji
Understanding the Physical Mechanism of RowPress at the Device-Level in Sub-20 nm DRAM. IRPS (2024)
Jinfeng Ye, Pengpeng Ren, Yongkang Xue, Hui Fang, Zhigang Ji
Fast Aging-Aware Timing Analysis Framework With Temporal-Spatial Graph Neural Network. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43 (6) (2024)
Da Wang, Yongkang Xue, Yong Liu, Pengpeng Ren, Zixuan Sun, Zirui Wang, Yueyang Liu, Zhijun Cheng, Haiyang Yang, Xiangli Liu, Blacksmith Wu, Kanyu Cao, Runsheng Wang, Zhigang Ji, Ru Huang
Sub-20-nm DRAM Technology under Negative Bias Temperature Instability (NBTI): from Characterization to Physical Origin Identification. IRPS (2024)
Zixuan Sun, Yongkang Xue, Haoran Lu, Pengpeng Ren, Zirui Wang, Zhigang Ji, Runsheng Wang, Ru Huang
Investigation of Interplays between Body Biasing and Hot Carrier Degradation (HCD) in Advanced NMOS FinFETs. IRPS (2024)
Bin Lin, Tao Peng, Chen Zhang, Minmin Sun, Lanbo Li, Hanyu Zhao, Wencong Xiao, Qi Xu, Xiafei Qiu, Shen Li, Zhigang Ji, Yong Li, Wei Lin
Infinite-LLM: Efficient LLM Service for Long Context with DistAttention and Distributed KVCache. CoRR (2024)
Shuying Wang, Yewei Zhang, Yunjoong Kim, Pengpeng Ren, Zhigang Ji
A Thermal Profile Prediction Methodology for Nanosheet Circuits Featuring Cross-Layer Thermal Coupling Effect. IRPS (2024)
Yu Xiao, Chenyang Zhang, Da Wang, Yongkang Xue, Pengpeng Ren, Zhigang Ji
A New Method of Automatic Extraction of RTN and OMI-Friendly Implementation. IRPS (2024)
Shiyu Xia, Longda Zhou, Kewei Wang, Xiaobin Fan, Yongkang Xue, Qi Shan, Hannian Wang, Pengpeng Ren, Zhigang Ji, Ru Huang
Convolution-Based Vth Shift Prediction and the New 9T2C Pixel Circuit in LTPS TFT AMOLED. IRPS (2024)
Yongkang Xue, Miaojia Yuan, Yu Li, Da Wang, Maokun Wu, Pengpeng Ren, Lining Zhang, Runsheng Wang, Zhigang Ji, Ru Huang
Investigation of Positive Bias Temperature Instability in advanced FinFET nodes. IRPS (2024)
Pengpeng Ren, Yongkang Xue, Linglin Jing, Lining Zhang, Runsheng Wang, Zhigang Ji
A strong physical unclonable function with machine learning immunity for Internet of Things application. Sci. China Inf. Sci. 67 (1) (2024)
Linglin Jing, Sheng Xu, Yifan Wang, Yuzhe Zhou, Tao Shen, Zhigang Ji, Hui Fang, Zhen Li, Siqi Sun
CrossBind: Collaborative Cross-Modal Identification of Protein Nucleic-Acid-Binding Residues. AAAI (2024)
Hai-Bao Chen, Xinjie Zhang, Wenjie Zhu, Jie Chen, Pengpeng Ren, Zhigang Ji, Junhua Liu, Runsheng Wang, Ru Huang
DRGA-Based Second-Order Block Arnoldi Method for Model Order Reduction of MIMO RCS Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 71 (5) (2024)
Yishan Wu, Puyang Cai, Zhiwei Liu, Pengpeng Ren, Zhigang Ji
Towards the understanding of ferroelectric-intrinsic variability and reliability issues on MCAM. IRPS (2023)
Xiang Liu, Pengpeng Ren, Hai-Bao Chen, Zhigang Ji, Junhua Liu, Runsheng Wang, Jianfu Zhang, Ru Huang
Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation With Both High Accuracy and Efficiency. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42 (4) (2023)
Xinfa Zhang, Zuodong Zhang, Yibo Lin, Zhigang Ji, Runsheng Wang, Ru Huang
Efficient Aging-Aware Standard Cell Library Characterization Based on Sensitivity Analysis. IEEE Trans. Circuits Syst. II Express Briefs 70 (2) (2023)
Kean Hong Tok, Jian Fu Zhang, James Brown, Zhigang Ji, Weidong Zhang
Extracting statistical distributions of RTN originating from both acceptor-like and donor-like traps. ASICON (2023)
Kaicheng Yang, Yuhan Wu, Ruijie Miao, Tong Yang, Zirui Liu, Zicang Xu, Rui Qiu, Yikai Zhao, Hanglong Lv, Zhigang Ji, Gaogang Xie
ChameleMon: Shifting Measurement Attention as Network State Changes. SIGCOMM (2023)
Zuoyuan Dong, Zixuan Sun, Xin Yang, Xiaomei Li, Yongkang Xue, Chen Luo, Puyang Cai, Zirui Wang, Shuying Wang, Yewei Zhang, Chaolun Wang, Pengpeng Ren, Zhigang Ji, Xing Wu, Runsheng Wang, Ru Huang
Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence. VLSI Technology and Circuits (2023)
Tianshu Hou, Ngai Wong, Quan Chen, Zhigang Ji, Hai-Bao Chen
Analytical Post-Voiding Modeling and Efficient Characterization of EM Failure Effects Under Time-Dependent Current Stressing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42 (12) (2023)
Zixuan Sun, Haoran Lu, Yongkang Xue, Wenpu Luo, Zirui Wang, Jiayang Zhang, Zhigang Ji, Runsheng Wang, Ru Huang
Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology. IRPS (2023)
Peining Zhen, Shuqi Wang, Suming Zhang, Xiaotao Yan, Wei Wang, Zhigang Ji, Hai-Bao Chen
Towards Accurate Oriented Object Detection in Aerial Images with Adaptive Multi-level Feature Fusion. ACM Trans. Multim. Comput. Commun. Appl. 19 (1) (2023)
Kaicheng Yang, Yuhan Wu, Ruijie Miao, Tong Yang, Zirui Liu, Zicang Xu, Rui Qiu, Yikai Zhao, Hanglong Lv, Zhigang Ji, Gaogang Xie
ChameleMon: Shifting Measurement Attention as Network State Changes. CoRR (2023)
Tianshu Hou, Peining Zhen, Zhigang Ji, Hai-Bao Chen
A Deep Learning Framework for Solving Stress-based Partial Differential Equations in Electromigration Analysis. ACM Trans. Design Autom. Electr. Syst. 28 (4) (2023)
James Brown, Kean Hong Tok, Rui Gao, Zhigang Ji, Weidong Zhang, John S. Marsland, Thomas Chiarella, Jacopo Franco, Ben Kaczer, Dimitri Linten, Jianfu Zhang
A Pragmatic Model to Predict Future Device Aging. IEEE Access 11 (2023)
Longda Zhou, Jie Li, Zheng Qiao, Pengpeng Ren, Zixuan Sun, Jianping Wang, Blacksmith Wu, Zhigang Ji, Runsheng Wang, Kanyu Cao, Ru Huang
Double-sided Row Hammer Effect in Sub-20 nm DRAM: Physical Mechanism, Key Features and Mitigation. IRPS (2023)
Da Wang, Yong Liu, Pengpeng Ren, Longda Zhou, Zhigang Ji, Junhua Liu, Runsheng Wang, Ru Huang
Characterization and Modelling of Hot Carrier Degradation in pFETs under Vd>Vg Condition for sub-20nm DRAM Technologies. IRPS (2022)
Linglin Jing, Yifan Wang, Tailin Chen, Shirin Dora, Zhigang Ji, Hui Fang
Towards a more efficient few-shot learning-based human gesture recognition via dynamic vision sensors. BMVC (2022)
Tianshu Hou, Ngai Wong, Quan Chen, Zhigang Ji, Hai-Bao Chen
A Space-Time Neural Network for Analysis of Stress Evolution Under DC Current Stressing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (12) (2022)
Yong Liu, Pengpeng Ren, Da Wang, Longda Zhou, Zhigang Ji, Junhua Liu, Runsheng Wang, Ru Huang
New Insight into the Aging Induced Retention Time Degraded of Advanced DRAM Technology. IRPS (2022)
Xuepeng Zhan, Jiezhi Chen, Zhigang Ji
Insights of VG-dependent threshold voltage fluctuations from dual-point random telegraph noise characterization in nanoscale transistors. Sci. China Inf. Sci. 65 (8) (2022)
Pengpeng Ren, Xinfa Zhang, Junhua Liu, Runsheng Wang, Zhigang Ji, Ru Huang
Towards the Characterization of Full ID-VG Degradation in Transistors for Future Analog Applications. IRPS (2022)
Mehzabeen Mehedi, Kean Hong Tok, Jian F. Zhang, Zhigang Ji, Zengliang Ye, Weidong Zhang, John S. Marsland
An integrated method for extracting the statistical distribution of RTN time constants. ASICON (2021)
Peining Zhen, Hai-Bao Chen, Yuan Cheng, Zhigang Ji, Bin Liu, Hao Yu
Fast Video Facial Expression Recognition by a Deeply Tensor-Compressed LSTM Neural Network for Mobile Devices. ACM Trans. Internet Things 2 (4) (2021)
Hao Chang, Longda Zhou, Hong Yang, Zhigang Ji, Qianqian Liu, Eddy Simoen, Huaxiang Yin, Wenwu Wang
Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs. IRPS (2021)
Longda Zhou, Zhaohao Zhang, Hong Yang, Zhigang Ji, Qianqian Liu, Qingzhu Zhang, Eddy Simoen, Huaxiang Yin, Jun Luo, Anyan Du, Chao Zhao, Wenwu Wang
A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/ AC NBTI Stress/Recovery Condition in Si p-FinFETs. IRPS (2021)
Mehzabeen Mehedi, Kean Hong Tok, Zengliang Ye, Jianfu Zhang, Zhigang Ji, Weidong Zhang, John S. Marsland
On the Accuracy in Modeling the Statistical Distribution of Random Telegraph Noise Amplitude. IEEE Access 9 (2021)
Zhigang Ji, Jianfu Zhang
Understanding Generated RTN as an Entropy Source for True Random Number Generators. ICICDT (2021)
Chunyang Liu, Pengpeng Ren, Bo Zhou, Jianfu Zhang, Hui Fang, Zhigang Ji
Investigation on the Implementation of Stateful Minority Logic for Future In-Memory Computing. IEEE Access 9 (2021)
Xuepeng Zhan, Yifang Xi, Qianwen Wang, Weiqiang Zhang, Zhigang Ji, Jiezhi Chen
Dual-Point Technique for Multi-Trap RTN Signal Extraction. IEEE Access 8 (2020)
Koh Song Sang, Bo Zhou, Hui Fang, Po Yang, Zaili Yang, Qiang Yang, Lin Guan, Zhigang Ji
Real-time deep reinforcement learning based vehicle navigation. Appl. Soft Comput. 96 (2020)
Mehzabeen Mehedi, Kean Hong Tok, Jianfu Zhang, Zhigang Ji, Zengliang Ye, Weidong Zhang, John S. Marsland
An Assessment of the Statistical Distribution of Random Telegraph Noise Time Constants. IEEE Access 8 (2020)
Longda Zhou, Qingzhu Zhang, Hong Yang, Zhigang Ji, Zhaohao Zhang, Renren Xu, Huaxiang Yin, Wenwu Wang
Comparative Study on the Energy Profile of NBTI-Related Defects in Si and Ferroelectric p-FinFETs. IRPS (2020)
Linglin Jing, Rui Gao, Zhigang Ji, Runsheng Wang
"Shift and Match" (S...M) method for channel mobility correction in degraded MOSFETs. IRPS (2020)
Rui Gao, Mehzabeen Mehedi, Haibao Chen, Xinsheng Wang, Jianfu Zhang, Xiaoling Lin, Zhiyuan He, Yiqiang Chen, Dengyun Lei, Yun Huang, Yunfei En, Zhigang Ji, Runsheng Wang
A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs. IRPS (2020)
Jianfu Zhang, Azrif Manut, Rui Gao, Mehzabeen Mehedi, Zhigang Ji, Weidong Zhang, John S. Marsland
An assessment of RTN-induced threshold voltage jitter. ASICON (2019)
Zhigang Ji, Haibao Chen, Xiuyan Li
Design for reliability with the advanced integrated circuit (IC) technology: challenges and opportunities. Sci. China Inf. Sci. 62 (12) (2019)
Jianfu Zhang, Meng Duan, Zhigang Ji, Weidong Zhang
Hot carrier aging of nano-scale devices: Characterization method, statistical variation, and their impact on use voltage. ASICON (2017)
Haoyu Song, Zhigang Ji, Yali Zhang, Yinben Xia
3D Fabric: Differential Deceleration and Detour for Congestion Free Data Center Networks. SIGCOMM Posters and Demos (2017)
Longfei Dai, Wenguo Yang, Suixiang Gao, Yinben Xia, Mingming Zhu, Zhigang Ji
Non-Real-Time Network Traffic in Software-Defined Networking: A Link Bandwidth Prediction-Based Algorithm. Comput. Inf. Sci. 8 (1) (2015)
Jianfu Zhang, Meng Duan, Zhigang Ji, Weidong Zhang
NBTI prediction and its induced time dependent variation. ASICON (2015)
Sharifah Wan Muhamad Hatta, Zhigang Ji, Jianfu Zhang, Weidong Zhang, Norhayati Soin, Ben Kaczer, Stefan De Gendt, Guido Groeseneken
Energy distribution of positive charges in high-k dielectric. Microelectron. Reliab. 54 (9-10) (2014)
Longfei Dai, Wenguo Yang, Suixiang Gao, Yinben Xia, Mingming Zhu, Zhigang Ji
EMD-Based Multi-Model Prediction for Network Traffic in Software-Defined Networks. MASS (2014)
Zhigang Ji
The Research on Modeling Document Summarization for Audio-Based Knowledge Management. J. Softw. 5 (11) (2010)
Zhigang Ji
Evaluation of Management Information System Based on Fuzzy AHP and Multiple Matter Elements. PACCS (2009)
Zhigang Ji, Meiye Zhang, Zhenguo Zhang
Evaluate the Selection of Logistics Centre Location Using SVM Based on Principal Component Analysis. PACCS (2009)
Zhigang Ji, Niugai Fang, Haiyan Yang
Research on Knowledge Management for Person in E-learning. SSME (2009)
Zhigang Ji, Yajing Li
The Application of RBF Neural Network on Construction Cost Forecasting. WKDD (2009)