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Analytical Post-Voiding Modeling and Efficient Characterization of EM Failure Effects Under Time-Dependent Current Stressing.

Tianshu HouNgai WongQuan ChenZhigang JiHai-Bao Chen
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2023)
Keyphrases
  • expectation maximization
  • unsupervised learning
  • cost effective
  • databases
  • machine learning
  • highly efficient
  • travel time
  • database
  • genetic algorithm
  • learning algorithm
  • e learning
  • data structure
  • em algorithm