Kanyu Cao

Publication Activity (10 Years)

Years Active: 2019-2024
Publications (10 Years): 10

Top Topics

Error Accumulation

Top Venues

Publications

Da Wang, Yongkang Xue, Yong Liu, Pengpeng Ren, Zixuan Sun, Zirui Wang, Yueyang Liu, Zhijun Cheng, Haiyang Yang, Xiangli Liu, Blacksmith Wu, Kanyu Cao, Runsheng Wang, Zhigang Ji, Ru Huang
Sub-20-nm DRAM Technology under Negative Bias Temperature Instability (NBTI): from Characterization to Physical Origin Identification. IRPS (2024)
Longda Zhou, Jie Li, Zheng Qiao, Pengpeng Ren, Zixuan Sun, Jianping Wang, Blacksmith Wu, Zhigang Ji, Runsheng Wang, Kanyu Cao, Ru Huang
Double-sided Row Hammer Effect in Sub-20 nm DRAM: Physical Mechanism, Key Features and Mitigation. IRPS (2023)
Z. Asher Bai, Yixian Wang, Lixue Liu, Xi Zhang, Feng Yuan, Junsheng Meng, Zhongming Liu, Js Jeon, James Cho, Blacksmith Wu, Huihui Li, Guilei Wang, Chao Zhao, Kanyu Cao
Dielectric Relaxation Performance of DRAM Storage Capacitors and Ways of Improvement. IMW (2023)
Yanzhe Tang, Zhongming Liu, Weibing Shang, Fengqin Zhang, Bernard Wu, Zhong Kong, Hongwen Li, Hong Ma, Kanyu Cao
Pitch Device Design in 10nm-Class DRAM Process through DTCO. ASICON (2021)
Xiong Li, Huangxia Zhu, Xiaolin Guo, Kejun Mu, Peng Feng, Qi-An Xu, Blacksmith Wu, Kanyu Cao
Impact of Hydrogen Anneal on Peripheral PMOS NBTI and Array Transistor GIDL in DRAM. ASICON (2021)
Yanwu Du, Chris Eom, Jake Jung, Brian Lee, Edwin Kim, Kanyu Cao
Adaptive OCD and ODT Control for Channel S/I Enhancement in DDR4 SDRAM. ASICON (2021)
Yinchuan Gu, Chris Eom, Jake Jung, Brian Lee, Edwin Kim, Kanyu Cao
A 2-stage with 3-stack 1-tap DFE Sense Amplifier based on Dual Reference for High Speed & Low Power DRAM Interface. ASICON (2021)
Siman Li, Chris Eom, Jake Jung, Brian Lee, Edwin Kim, Kanyu Cao
Adaptive DLL Update Scheme for Power Fluctuation Immunity Using Phase Error Detector. ASICON (2021)
Jingrui Ma, Qi-An Xu, Blacksmith Wu, Kanyu Cao
Improved Model for ESD Failure Caused by Stressing No Connect Pin. ASICON (2019)
Ning Li, Wen-Yang Jiang, Blacksmith Wu, Kanyu Cao
Improve DRAM Leakage Issue During RAS Operational Phase Through TCAD Simulation. ASICON (2019)