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Kanyu Cao
Publication Activity (10 Years)
Years Active: 2019-2024
Publications (10 Years): 10
Top Topics
Storage Cost
Key Features
Error Accumulation
Low Power
Top Venues
ASICON
IRPS
IMW
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Publications
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Da Wang
,
Yongkang Xue
,
Yong Liu
,
Pengpeng Ren
,
Zixuan Sun
,
Zirui Wang
,
Yueyang Liu
,
Zhijun Cheng
,
Haiyang Yang
,
Xiangli Liu
,
Blacksmith Wu
,
Kanyu Cao
,
Runsheng Wang
,
Zhigang Ji
,
Ru Huang
Sub-20-nm DRAM Technology under Negative Bias Temperature Instability (NBTI): from Characterization to Physical Origin Identification.
IRPS
(2024)
Longda Zhou
,
Jie Li
,
Zheng Qiao
,
Pengpeng Ren
,
Zixuan Sun
,
Jianping Wang
,
Blacksmith Wu
,
Zhigang Ji
,
Runsheng Wang
,
Kanyu Cao
,
Ru Huang
Double-sided Row Hammer Effect in Sub-20 nm DRAM: Physical Mechanism, Key Features and Mitigation.
IRPS
(2023)
Z. Asher Bai
,
Yixian Wang
,
Lixue Liu
,
Xi Zhang
,
Feng Yuan
,
Junsheng Meng
,
Zhongming Liu
,
Js Jeon
,
James Cho
,
Blacksmith Wu
,
Huihui Li
,
Guilei Wang
,
Chao Zhao
,
Kanyu Cao
Dielectric Relaxation Performance of DRAM Storage Capacitors and Ways of Improvement.
IMW
(2023)
Yanzhe Tang
,
Zhongming Liu
,
Weibing Shang
,
Fengqin Zhang
,
Bernard Wu
,
Zhong Kong
,
Hongwen Li
,
Hong Ma
,
Kanyu Cao
Pitch Device Design in 10nm-Class DRAM Process through DTCO.
ASICON
(2021)
Xiong Li
,
Huangxia Zhu
,
Xiaolin Guo
,
Kejun Mu
,
Peng Feng
,
Qi-An Xu
,
Blacksmith Wu
,
Kanyu Cao
Impact of Hydrogen Anneal on Peripheral PMOS NBTI and Array Transistor GIDL in DRAM.
ASICON
(2021)
Yanwu Du
,
Chris Eom
,
Jake Jung
,
Brian Lee
,
Edwin Kim
,
Kanyu Cao
Adaptive OCD and ODT Control for Channel S/I Enhancement in DDR4 SDRAM.
ASICON
(2021)
Yinchuan Gu
,
Chris Eom
,
Jake Jung
,
Brian Lee
,
Edwin Kim
,
Kanyu Cao
A 2-stage with 3-stack 1-tap DFE Sense Amplifier based on Dual Reference for High Speed & Low Power DRAM Interface.
ASICON
(2021)
Siman Li
,
Chris Eom
,
Jake Jung
,
Brian Lee
,
Edwin Kim
,
Kanyu Cao
Adaptive DLL Update Scheme for Power Fluctuation Immunity Using Phase Error Detector.
ASICON
(2021)
Jingrui Ma
,
Qi-An Xu
,
Blacksmith Wu
,
Kanyu Cao
Improved Model for ESD Failure Caused by Stressing No Connect Pin.
ASICON
(2019)
Ning Li
,
Wen-Yang Jiang
,
Blacksmith Wu
,
Kanyu Cao
Improve DRAM Leakage Issue During RAS Operational Phase Through TCAD Simulation.
ASICON
(2019)