Improved Model for ESD Failure Caused by Stressing No Connect Pin.
Jingrui MaQi-An XuBlacksmith WuKanyu CaoPublished in: ASICON (2019)
Keyphrases
- probabilistic model
- computational model
- high level
- mathematical model
- artificial intelligence
- theoretical analysis
- computational models
- sensitivity analysis
- autoregressive
- real time
- parameter values
- formal model
- theoretical foundation
- statistical model
- theoretical framework
- input data
- probability distribution
- artificial neural networks