Login / Signup
Investigation of Interplays between Body Biasing and Hot Carrier Degradation (HCD) in Advanced NMOS FinFETs.
Zixuan Sun
Yongkang Xue
Haoran Lu
Pengpeng Ren
Zirui Wang
Zhigang Ji
Runsheng Wang
Ru Huang
Published in:
IRPS (2024)
Keyphrases
</>
human body
special case
data sets
learning algorithm
website
relational databases
body parts
action selection
dynamic logic