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Characterization and Modelling of Hot Carrier Degradation in pFETs under Vd>Vg Condition for sub-20nm DRAM Technologies.

Da WangYong LiuPengpeng RenLongda ZhouZhigang JiJunhua LiuRunsheng WangRu Huang
Published in: IRPS (2022)
Keyphrases
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