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Comparative Study on the Energy Profile of NBTI-Related Defects in Si and Ferroelectric p-FinFETs.
Longda Zhou
Qingzhu Zhang
Hong Yang
Zhigang Ji
Zhaohao Zhang
Renren Xu
Huaxiang Yin
Wenwu Wang
Published in:
IRPS (2020)
Keyphrases
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comparative study
energy minimization
failure modes
image processing
case study
closely related