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Comparative Study on the Energy Profile of NBTI-Related Defects in Si and Ferroelectric p-FinFETs.

Longda ZhouQingzhu ZhangHong YangZhigang JiZhaohao ZhangRenren XuHuaxiang YinWenwu Wang
Published in: IRPS (2020)
Keyphrases
  • comparative study
  • energy minimization
  • failure modes
  • image processing
  • case study
  • closely related