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Towards the Characterization of Full ID-VG Degradation in Transistors for Future Analog Applications.

Pengpeng RenXinfa ZhangJunhua LiuRunsheng WangZhigang JiRu Huang
Published in: IRPS (2022)
Keyphrases
  • circuit design
  • power consumption
  • long term
  • real time
  • neural network
  • real world
  • image processing
  • bayesian networks
  • signal processing
  • high power