Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence.
Zuoyuan DongZixuan SunXin YangXiaomei LiYongkang XueChen LuoPuyang CaiZirui WangShuying WangYewei ZhangChaolun WangPengpeng RenZhigang JiXing WuRunsheng WangRu HuangPublished in: VLSI Technology and Circuits (2023)