Yunfei En

Publication Activity (10 Years)

Years Active: 2008-2023
Publications (10 Years): 14

Top Topics

Quality Evaluation

Spectrum Analysis

Microstrip Antenna

Top Venues

IEEE Trans. Circuits Syst. II Express Briefs

Microelectron. Reliab.

Publications

Lei Wang, Xiaoxian Liu, Yunfei En, Zhangming Zhu
A Composite Probe Capable of Simultaneously Measuring Two Orthogonal Magnetic-Fields. IEEE Trans. Circuits Syst. II Express Briefs 70 (2) (2023)
Lei Wang, Yunfei En, Zhangming Zhu
An Ultrawideband Multicomponent Differential Magnetic Probe for Near-Field Scanning. IEEE Trans. Circuits Syst. II Express Briefs 69 (11) (2022)
Chao Peng, Rui Gao, Zhifeng Lei, Zhangang Zhang, Yiqiang Chen, Yunfei En, Yun Huang
Research on Negative Bias Temperature Instability Effects Under the Coupling of Total Ionizing Dose Irradiation for PDSOI MOSFETs. IEEE Access 9 (2021)
Chenbing Qu, Zhangming Zhu, Yunfei En, Liwei Wang, Xiaoxian Liu
Area-Efficient Extended 3-D Inductor Based on TSV Technology for RF Applications. IEEE Trans. Very Large Scale Integr. Syst. 29 (2) (2021)
Chao Peng, Zhifeng Lei, Rui Gao, Zhangang Zhang, Yiqiang Chen, Yunfei En, Yun Huang
Investigation of Negative Bias Temperature Instability Effect in Partially Depleted SOI pMOSFET. IEEE Access 8 (2020)
Lei Wang, Wenxiao Fang, Wei-Heng Shao, Bin Yao, Yun Huang, Yunfei En
Broadband Circularly Polarized Cross-Dipole Antenna With Multiple Modes. IEEE Access 8 (2020)
Rui Gao, Mehzabeen Mehedi, Haibao Chen, Xinsheng Wang, Jianfu Zhang, Xiaoling Lin, Zhiyuan He, Yiqiang Chen, Dengyun Lei, Yun Huang, Yunfei En, Zhigang Ji, Runsheng Wang
A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs. IRPS (2020)
Yueyang Liu, Xiangwei Jiang, Liwei Wang, Yunfei En, Runsheng Wang
Distinguishing Interfacial Hole Traps in (110), (100) High-K Gate Stack. IRPS (2019)
Lei Wang, Wenxiao Fang, Yunfei En, Yun Huang, Wei-Heng Shao, Bin Yao
Wideband Circularly Polarized Cross-Dipole Antenna With Parasitic Elements. IEEE Access 7 (2019)
Xiaolei Ma, Xiangwei Jiang, Jiezhi Chen, Liwei Wang, Yunfei En
Scaling Behaviour of State-to-State Coupling During Hole Trapping at Si/SiO2. IRPS (2019)
Si Chen, Zhizhe Wang, Yunfei En, Yun Huang, Fei Qin, Tong An
The experimental analysis and the mechanical model for the debonding failure of TSV-Cu/Si interface. Microelectron. Reliab. 91 (2018)
Chao Peng, Yunfei En, Zhengxuan Zhang, Yuan Liu, Zhifeng Lei
Radiation induced transconductance overshoot in the 130 nm partially-depleted SOI MOSFETs. Microelectron. Reliab. 75 (2017)
Haimi Qiu, Wenxiao Fang, Yunfei En, Yun Huang, Yuan Liu, Ping Lai, Yiqiang Chen, Chunlei Shi
Movable Noncontact RF Current Measurement on a PCB Trace. IEEE Trans. Instrum. Meas. 66 (9) (2017)
Dengyun Lei, Liwei Wang, Jun Lin, Yunfei En
Quality Evaluation of Digital Soft IP Core for FPGA System. QRS Companion (2017)
Chunhua He, Bo Hou, Liwei Wang, Yunfei En, Shaofeng Xie
A failure physics model for hardware Trojan detection based on frequency spectrum analysis. IRPS (2015)
Jie Liu, Jicheng Zhou, Hongwei Luo, Xuedong Kong, Yunfei En, Qian Shi, Yujuan He
Total-dose-induced edge effect in SOI NMOS transistors with different layouts. Microelectron. Reliab. 50 (1) (2010)
Yunfei En, Yujuan He, Hongwei Luo, Qian Shi, Xianjun Kuang, Zhijian Pan
The irradiation effect of DC-DC power converter under X-ray. APCCAS (2008)